Industrial Applications on ViCoS Lab

End-to-end training of a two-stage neural network for defect detection

Mon, 01 Jan 0001 00:00:00 +0000

Segmentation-based, two-stage neural network has shown excellent results in the surface defect detection, enabling the network to learn from a relatively small number of samples. In this work, we introduce end-to-end training of the two-stage network together with several extensions to the training process, which reduce the amount of training time and improve the results on the surface defect detection tasks. To enable end-toend training we carefully balance the contributions of both the segmentation and the classification loss throughout the learning. We adjust the gradient flow from the classification into the segmentation network in order to prevent the unstable features from corrupting the learning. As an additional extension to the learning, we propose frequency-of-use sampling scheme of negative samples to address the issue of over- and under-sampling of images during the training, while we employ the distance transform algorithm on the region-based segmentation masks as weights for positive pixels, giving greater importance to areas with higher probability of presence of defect without requiring a detailed annotation. We demonstrate the performance of the end-to-end training scheme and the proposed extensions on three defect detection datasets—DAGM, KolektorSDD and Severstal Steel defect dataset— where we show state-of-the-art results. On the DAGM and the KolektorSDD we demonstrate 100% detection rate, therefore completely solving the datasets. Additional ablation study performed on all three datasets quantitatively demonstrates the contribution to the overall result improvements for each of the proposed extensions.

Mixed supervision for surface-defect detection: from weakly to fully supervised learning

Mon, 01 Jan 0001 00:00:00 +0000

Deep-learning methods have recently started being employed for addressing surface-defect detection problems in industrial quality control. However, with a large amount of data needed for learning, often requiring high-precision labels, many industrial problems cannot be easily solved, or the cost of the solutions would significantly increase due to the annotation requirements. In this work, we relax heavy requirements of fully supervised learning methods and reduce the need for highly detailed annotations. By proposing a deep-learning architecture, we explore the use of annotations of different details ranging from weak (image-level) labels through mixed supervision to full (pixel-level) annotations on the task of surface-defect detection. The proposed end-to-end architecture is composed of two sub-networks yielding defect segmentation and classification results. The proposed method is evaluated on several datasets for industrial quality inspection: KolektorSDD, DAGM and Severstal Steel Defect. We also present a new dataset termed KolektorSDD2 with over 3000 images containing several types of defects, obtained while addressing a real-world industrial problem. We demonstrate state-of-the-art results on all four datasets. The proposed method outperforms all related approaches in fully supervised settings and also outperforms weakly-supervised methods when only image-level labels are available. We also show that mixed supervision with only a handful of fully annotated samples added to weakly labelled training images can result in performance comparable to the fully supervised model’s performance but at a significantly lower annotation cost.

Segmentation-Based Deep-Learning Approach for Surface-Defect Detection

Mon, 01 Jan 0001 00:00:00 +0000

Automated surface-anomaly detection using machine learning has become an interesting and promising area of research, with a very high and direct impact on the application domain of visual inspection. Deep-learning methods have become the most suitable approaches for this task. They allow the inspection system to learn to detect the surface anomaly by simply showing it a number of exemplar images. This paper presents a segmentation-based deep-learning architecture that is designed for the detection and segmentation of surface anomalies and is demonstrated on a specific domain of surface-crack detection. The design of the architecture enables the model to be trained using a small number of samples, which is an important requirement for practical applications. The proposed model is compared with the related deep-learning methods, including the state-of-the-art commercial software, showing that the proposed approach outperforms the related methods on the specific domain of surface-crack detection. The large number of experiments also shed light on the required precision of the annotation, the number of required training samples and on the required computational cost. Experiments are performed on a newly created dataset based on a real-world quality control case and demonstrates that the proposed approach is able to learn on a small number of defected surfaces, using only approximately 25-30 defective training samples, instead of hundreds or thousands, which is usually the case in deep-learning applications. This makes the deep-learning method practical for use in industry where the number of available defective samples is limited. The dataset is also made publicly available to encourage the development and evaluation of new methods for surface-defect detection.